Senior Scientist (MIV/OIS), SIMTech

Agency for Science, Technology and Research • Doctoral Degree (PhD) • 23 days ago

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Salary

≈ $42k – $94k per year (Estimated)

Location

In office (Singapore)

Seniority

Senior

Confirmed on the employer's own hiring board on Oct 19, 2026. First seen by Alion on Sep 25, 2026. Agency for Science, Technology and Research scores B on the Alion truth index.

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Agency for Science, Technology and Research

The Agency for Science, Technology and Research is a leading public sector organization dedicated to advancing economic-oriented scientific discovery and technological innovation. Headquartered in Singapore, the agency oversees numerous specialized research institutes spanning biomedical sciences, physical sciences, and engineering. By bridging the gap between academia and industry, it fosters public-private partnerships, cultivates scientific talent, and propels the growth of the regional innovation ecosystem.

a-star.edu.sg • HQ: Singapore • Research Institutes • 1001-5000 employees • Est. 1991

Tech stack of Agency for Science, Technology and Research

Role Summary

The Optics and Imaging Systems (OIS) Group of Singapore Institute of Manufacturing Technology (SIMTech) is seeking a highly self-motivated scientist or senior scientist to drive, initiate, and lead R&D on novel X-ray inspection technologies, systems, and applications for internal defects detection with advanced semiconductor packaging.

The candidate will play a leading role in understanding the challenges that the semiconductor industry is facing today for internal defects inspection, exploring and proposing novel R&D topics on X-ray inspection and metrology technologies, and translating R&D IPs to novel industrial solutions and semiconductor equipment.

Focused areas include, but are not limited to, the following:

Novel nano-X-ray inspection technology/system for Semiconductor Manufacturing
Science for X-ray interaction with materials and its impact on X-ray 2D imaging and CT reconstruction
AI-assisted defects/artefacts detection, classification and prioritization for failure analysis
Nano X-ray source with smaller focal-spot, longer lifetime and higher brightness
AI-assisted fast X-ray imaging and reconstruction

Job Requirements

PhD degree in Physics, Material Inspection and Analysis, or other relevant disciplines
Candidates with strong publications/patents on high-resolution X-ray imaging, and X-ray and material interaction for semiconductor manufacturing
Deep understanding to defects detection, metrology and failure analysis in semiconductor manufacturing
Demonstrate strong ability of using scientific software/equipment for defects detection, analysis and simulation
Experience on developing X-ray inspection, measurement and analysis solutions for industrial applications, or working with leading R&D institute on X-ray technology development
Innovative, self-driven, adaptable, and proactive team player with the ability to work across disciplines

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