{"id":1253600,"url":"https://alion.io/job/astar-senior-scientist-mivois-simtech","title":"Senior Scientist (MIV/OIS), SIMTech","company":{"id":50235,"name":"Agency for Science, Technology and Research","domain":"a-star.edu.sg","url":"https://alion.io/company/a-star-edu","size_band":"1001-5000","is_staffing_agency":false,"employer_type":"direct","is_intermediary":false,"listed_via":null,"ats_vendor":"SuccessFactors","truth_index":{"grade":"B","score":80,"open_postings":46,"ghost_share":0,"stale_share":1,"repost_share":0,"time_to_fill_p50_days":21,"computed_at":"2026-10-21T05:46:15Z"}},"role":"Science & Research","role_family":"Science & Research","seniority":"senior","employment_type":null,"work_mode":"on_site","remote_scope":null,"remote_scope_basis":null,"remote_working_hours":null,"hiring_geo_confidence":"structured","locations":["Singapore"],"countries":["SG"],"hiring_countries":[],"hiring_countries_total":0,"salary":null,"salary_estimate":{"min_usd":42000,"max_usd":95000,"period":"year","method":"global_role_cell_scaled_by_country","sample_n":1403},"experience_years_min":null,"visa_sponsorship":false,"relocation_package":false,"has_equity":false,"technologies":[],"status":"live","first_seen_at":"2026-09-25T18:38:00Z","employer_posted_date":"2026-09-25","last_verified_at":"2026-10-20T17:56:14Z","board_verified":true,"closed_at":null,"days_open":25,"trust":{"level":"ok","repost_count":null,"flags":[],"days_open":25},"description":"Role Summary\nThe Optics and Imaging Systems (OIS) Group of Singapore Institute of Manufacturing Technology (SIMTech) is seeking a highly self-motivated scientist or senior scientist to drive, initiate, and lead R&D on novel X-ray inspection technologies, systems, and applications for internal defects detection with advanced semiconductor packaging.\nThe candidate will play a leading role in understanding the challenges that the semiconductor industry is facing today for internal defects inspection, exploring and proposing novel R&D topics on X-ray inspection and metrology technologies, and translating R&D IPs to novel industrial solutions and semiconductor equipment.\nFocused areas include, but are not limited to, the following:\nNovel nano-X-ray inspection technology/system for Semiconductor Manufacturing\nScience for X-ray interaction with materials and its impact on X-ray 2D imaging and CT reconstruction\nAI-assisted defects/artefacts detection, classification and prioritization for failure analysis\nNano X-ray source with smaller focal-spot, longer lifetime and higher brightness\nAI-assisted fast X-ray imaging and reconstruction\nJob Requirements\nPhD degree in Physics, Material Inspection and Analysis, or other relevant disciplines\nCandidates with strong publications/patents on high-resolution X-ray imaging, and X-ray and material interaction for semiconductor manufacturing\nDeep understanding to defects detection, metrology and failure analysis in semiconductor manufacturing\nDemonstrate strong ability of using scientific software/equipment for defects detection, analysis and simulation\nExperience on developing X-ray inspection, measurement and analysis solutions for industrial applications, or working with leading R&D institute on X-ray technology development\nInnovative, self-driven, adaptable, and proactive team player with the ability to work across 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