{"id":3939516,"url":"https://alion.io/job/micro1-semiconductor-yield-defect-engineer-wafer-fab-sem-defect-review","title":"Semiconductor Yield / Defect Engineer (Wafer Fab, SEM Defect Review)","company":{"id":13196,"name":"micro1","domain":"micro1.ai","url":"https://alion.io/company/micro1","size_band":"51-200","is_staffing_agency":false,"employer_type":"direct","is_intermediary":true,"listed_via":null,"ats_vendor":null,"truth_index":null},"role":"Industrial Engineering","role_family":"Industrial Engineering","seniority":null,"employment_type":"contractor","work_mode":"remote","remote_scope":"unspecified","remote_scope_basis":null,"remote_working_hours":null,"hiring_geo_confidence":"inferred","locations":[],"countries":[],"hiring_countries":[],"hiring_countries_total":0,"salary":{"min":20,"max":60,"currency":"USD","period":"hour","gross":null,"usd_annual":120000},"salary_estimate":null,"experience_years_min":null,"visa_sponsorship":false,"relocation_package":false,"has_equity":false,"technologies":[{"name":"Electron Microscopy (SEM/TEM)","optional":false}],"status":"live","first_seen_at":"2026-11-08T07:20:33Z","employer_posted_date":null,"last_verified_at":"2026-11-08T07:20:33Z","board_verified":false,"closed_at":null,"days_open":2,"trust":{"level":"not_scored","repost_count":null,"flags":[],"days_open":2},"description":"Role Title: Semiconductor Yield / Defect Engineer (Wafer Fab, SEM Defect Review)\nRole Type: ContractorLocation: Remotemicro1 is engaging Semiconductor Yield / Defect Engineers (Wafer Fab, SEM Defect Review) to support a customer engagement focused on advancing semiconductor manufacturing analytics. In this role, you'll apply your expertise to help train next-generation AI systems. Your work will shape how models learn, reason, and perform through high-quality, real-world input. No prior experience in AI is required — your domain knowledge is what matters. This opportunity is ideal for yield, defect, or process integration experts with direct hands-on experience in wafer fab production environments, especially those familiar with facilities operating their own sort floors. Retired or former fab engineers are highly encouraged to participate and share their invaluable experience.\nScope of Work\nConduct SEM (Scanning Electron Microscope) defect review and accurate classification of defects observed in wafer fabrication processes.\n\nInterpret and analyze yield loss mechanisms, correlating defect patterns with process-related issues.\n\nEvaluate excursion events and make informed lot-hold or release recommendations based on empirical evidence and industry best practices.\n\nReview, interpret, and annotate wafer sort and test floor data, including bin maps and parametric datasets.\n\nIdentify defect paretos and contribute to source attribution analysis to trace root causes.\n\nDocument observations, communicate technical findings, and provide actionable feedback in clear, concise written and verbal formats for integration into AI learning modules.\n\nPreferred Qualifications\nExtensive hands-on experience in wafer fab environments, with a focus on SEM-based defect review and yield analysis.\n\nDemonstrated expertise in production fabs with integrated sort/test floors; experience limited to research cleanrooms does not qualify.\n\nProficiency with defect classification methodologies, excursion management, and yield improvement strategies.\n\nStrong ability to analyze wafer sort/bin data and interpret test floor metrics to inform defect and yield investigations.\n\nExceptional written and verbal communication skills, able to explain complex technical concepts to diverse audiences.\n\nBackground in process integration or defect/yield engineering at major semiconductor manufacturing facilities.\n\nExperience as a retired or former fab engineer considered a valuable asset.\n\nOriginally posted on Himalayas","description_format":"text","description_chars":2513,"description_truncated":false,"requirements":{"experience_years_min":null,"management_years_min":null,"team_size_min":null,"manages_managers":false,"education":null,"security_clearance":false,"languages":[]},"benefits":[],"hiring_locations":[],"hiring_excludes":[],"relocation_offered":false,"industries":["Freelance & Talent Marketplaces","AI Training Data & Annotation","AI Evaluation & Observability","HR & Recruiting AI"],"lifecycle":[{"event":"open","at":"2026-11-08T12:16:15Z"}],"visa":[{"country":"US","licensed_sponsor":true,"adverts_offering_sponsorship_24m":0,"sanctioned_now":false,"evidence":"H-1B filings in 12 months: 9","filings_12m":9,"filings_prev_12m":2,"green_card_filings_12m":0,"median_offered_wage_usd":167500,"route":null,"cap_exempt":false,"checked_at":"2026-11-09T07:32:21+00:00","sources":["US Department of Labor: LCA disclosure data (H-1B, H-1B1, E-3)"],"filings_for_role_12m":0}],"liveness":{"score":90,"band":"hot","label":"Hiring now","p_open":1,"p_active":0.903,"p_room":1,"age_days":1,"expected_fill_days":40,"reasons":["seen:1","velocity","win:early","comp:brand"],"computed_at":"2026-11-10T06:52:35Z"},"pay":{"stated_usd_annual":120000,"is_top_pay":false},"html_url":"https://alion.io/job/micro1-semiconductor-yield-defect-engineer-wafer-fab-sem-defect-review","json_url":"https://alion.io/job/micro1-semiconductor-yield-defect-engineer-wafer-fab-sem-defect-review.json","meta":{"generated_at":"2026-11-10T09:14:20Z","cache_seconds":300,"methodology":"https://alion.io/methodology","terms":"https://alion.io/terms","contact":"https://alion.io/contact","api":"https://alion.io/developers","about":"Alion is a live layer of people, companies and AI agents: who they are, whether they are real and active right now, what they do and how to work with them, readable by people and by agents and paid per call.","catalog":"https://alion.io/catalog.json","usage":{"tier":"crawler_verified","counted_by":"address","units_charged":1,"used_today":21530,"day_limit":null,"remaining_today":null,"minute_limit":300,"resets_at":"2026-11-11T00:00:00Z"}},"offers":[{"id":"company.slices","title":"One company in depth, by slice","status":"live","price":{"credits":0.1,"usd":0.01,"plus_per_slice":{"credits":0.05,"usd":0.005}},"unit":"per company, plus each slice with data","note":"the employer in depth","call":{"mcp_tool":"get_company","arguments":{"id":13196},"rest":"https://alion.io/mcp/rest/get_company?id=13196"},"human":"https://alion.io/catalog?offer=company.slices&for=job%2Fmicro1-semiconductor-yield-defect-engineer-wafer-fab-sem-defect-review"},{"id":"market.stats","title":"A market slice: pay, demand and time to fill","status":"live","price":{"credits":2,"usd":0.2},"unit":"per slice","note":"pay, demand and time to fill for this role and place","call":{"mcp_tool":"market_stats"},"human":"https://alion.io/catalog?offer=market.stats&for=job%2Fmicro1-semiconductor-yield-defect-engineer-wafer-fab-sem-defect-review"},{"id":"job.search","title":"Open jobs by role, technology, place, pay and visa","status":"live","price":{"credits":0.1,"usd":0.01},"unit":"per posting in a list","note":"similar open postings","call":{"mcp_tool":"search_jobs"},"human":"https://alion.io/catalog?offer=job.search&for=job%2Fmicro1-semiconductor-yield-defect-engineer-wafer-fab-sem-defect-review"},{"id":"company.verify","title":"Is this company real and active right now","status":"pilot","price":null,"unit":"per company","request":{"url":"https://alion.io/catalog/request","method":"POST","body":"{\"offer\": \"company.verify\", \"for\": \"job/micro1-semiconductor-yield-defect-engineer-wafer-fab-sem-defect-review\", \"note\": \"what you need it for\"}"},"human":"https://alion.io/catalog?offer=company.verify&for=job%2Fmicro1-semiconductor-yield-defect-engineer-wafer-fab-sem-defect-review"}],"agent":{"mcp":"https://alion.io/mcp/jobs","mcp_open":"https://alion.io/mcp/open","next":[{"tool":"get_job","arguments":{"id":3939516}},{"tool":"search_jobs","arguments":{"company":"micro1.ai","detail":"compact"}},{"tool":"match_people","arguments":{"job_id":3939516},"note":"people open to offers who fit this vacancy"}],"note":"The same data through MCP tools: https://alion.io/mcp/open needs no sign-in (compact searches, postings, people); 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